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CE Certified Thermal Shock Chamber For Semiconductor Testing
Production Description:
Specification:
Model |
ND-42 (A~C) |
ND-60 (A~C) |
ND-80 (A~C) |
ND-100 (A~C) |
ND-120 (A~C) |
ND-150 (A~C) |
Inner size: WHD(cm) | 40*30*35 | 50*30*40 | 50*40*40 | 50*50*40 | 60*40*50 | 60*50*50 |
External size: WHD(cm) | 150*180*150 | 160*175*160 | 160*185*160 | 160*185*170 | 170*185*170 | 170*195*170 |
Temperature range(Test Chamber) | high temperature:+60℃~+200℃;low temperature -10℃~-65℃(A:-45℃;B:-55℃;C:-65℃) | |||||
Heating Time | RT~200℃ About 30min | |||||
Cooling Time | RT~-70℃ About 85min | |||||
Temperature Conversion Time |
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